This article analyzes the physical-chemical surface properties of single-slit, single-groove subwavelength-structured silver films using high-resolution transmission electron microscopy (TEM), calculating solutions to Maxwell’s equations corresponding to far-field interferometry experiments using these specific structures.
Authors G. Gay, O. Alloschery, J. Weiner, H. J. Lezec, C. O’Dwyer, M. Sukharev, and T. Seideman found that, contrary to some recent suggestions, surface analysis revealed that the silver films are free of detectable contaminants.
Originally published by The American Physical Society in 2007, the article shows how fourier analysis of the results indicates that the transience, evanescent modes around the surface plasmon polariton (SPP) that diphase and dissipate as the surface wave evolves from the near to far zone.
The article can be found online at Physical Review E.
